Table 3: List of source comments and their explanations
Source comment Examples Flags Description

SPURIOUS:
False in extended ex1 3 7 Spurious detection associated with an extended emission
Wing of bright src ex1 7 Spurious detection in the wings of a bright source
Bright background ex1 7 Spurious detection due to high surface brightness (usually the halo of an unobserved bright source)
Bad background ex1 7 Spurious detection in a low surface brightness area where the background spline map seems to fail
Reflection arc ex1 7 Spurious detection on or near reflection arcs due to bright outside source
Cosmic ray ex1 7 Spurious detection due to cosmic ray
Out of time events ex1 7 Spurious detection in out of time events
Diffraction spike ex1 7 Spurious detection in RGA diffraction spike (MOS only)
Bright pixel ex1 7 Spurious detection due to bright (raw) pixel
Bright segment ex1 7 Spurious detection in bright segments of a row or column
Corner of CCD ex1 6 7 Spurious detection on the corner of a CCD (MOS only)
Bright corner of PW ex1 7 Spurious detection due to bright corner area of MOS central partial window
Split by CCD gap ex1 6 7 Source split into two detections by CCD edge (dimmer component)
Split by pileup ex1 6 7 Source split into two or more detections by pileup at the center of the source
Split by optical loadingex1 6 7Source split into two or more detections due to a hole by optical loading at the center of the source

Unknown -1 7 Source is part of a patch of low count sources without an obvious cause (that is, one of the above reasons)
WARNING:
Split by CCD gap ex5 6 7 Source split into two detections by CCD edge (brighter component)
Possible multiple ex7 Suspected multiple sources detected as a single source; count rate could be affected
Position offset ex5 7 Source position offset from image peak
Core of ext emission ex3 7 Source is at the core of the extended emission
Poss core of ext em ex7 Source is possibly at the core of the extended emission
Possibly extended ex7 Source is possibly extended
In extended ex3 7 Source is in extended emission area
Part of extended ex1 3 7 Source is due to a clump within extended emission (e.g., brighter part in a filament)
Near bright source ex7 Source near wings of bright source affecting count rate and/or position
In bright background regionex7 Source in an area where the bright background causes many spurious detections, affecting count rate
In bad background regionex7 Source in an area where the background spline map seems to fail and causes many spurious detections, affecting count rate
Near reflection arc ex7 Source on or near reflection arc due to bright outside source affecting count rate and/or position
Near cosmic ray ex7 Source on or near cosmic ray affecting count rate and/or position
Near OOT events ex7 Source near out of time events affecting count rate and/or position
Near diffraction spike ex7 Source on or near RGA diffraction spike (MOS only) affecting count rate and/or position
Near bright pixel ex7 Source on or near bright pixel affecting count rate and/or position
Near bright segment ex7 Source on or near bright segment affecting count rate and/or position
Near edge of field ex(5) 6 7Source on edge of field of view possibly affecting count rate and/or position
Near edge of CCD ex(5) 6 7Source on CCD edge possibly affecting count rate and/or position
Affected by optical loadingex7 Source is near a hole due to optical loading affecting count rate and/or position

Note: All comments on spurious detections can be also given as a 'Poss ...' with only flag 7 set.



Screening Notes Table: Version 29.05.2003