Table 3.3: Description of flag setting in visual screening of sources

Source comment Flags set    Description

SPURIOUS:
False in extended 1 3 7 Spurious detection associated with an extended emission
Wing of bright src 1 7 Spurious detection in the wings of a bright source
Out of time events 1 7 Spurious detection in out of time events
Diffraction spike 1 7 Spurious detection in RGA diffraction spike (MOS only)
Diffraction by RGA 1 7 Spurious detection in RGA diffraction spike (MOS only)
Bright pixel 1 7 Spurious detection due to bright (raw) pixel
Bright segment 1 7 Spurious detection in bright segments of a row or column
Corner of CCD 1 6 7 Spurious detection on the corner of a CCD (MOS only)
Bright corner of PW 1 7 Spurious detection due to bright corner area of MOS central partial window
Bright background 1 7 Spurious detection due to high background
Cosmic ray 1 7 Spurious detection due to cosmic ray
Reflection arc 1 7 Spurious detection on or near reflection arcs due to bright outside source
Bad background map 1 7 Spurious detection due to an area where the background spline map seems to fail
In bad background map region 1 7 Spurious detection due to an area where the background spline map seems to fail
Unknown 1 7 Source is part of a patch of low count sources, possibly due to problems with background subtraction

PROBLEMATIC:
Split by CCD gap 5 6 7 Source split into two detections by CCD edge (brighter component)
Split by CCD gap 1 6 7 Source split into two detections by CCD edge (dimmer component)
Split by pileup 5 6 7 Source split into two or more detections by saturation of the source (brighter component)
Split by pileup 1 6 7 Source split into two or more detections by saturation of the source (dimmer component)
 
 
Possible multiple 7 Suspected multiple sources detected as a single source; count rate could be affected
Position offset 5 7 Source position offset from image peak
 
 
Near OOT events 7 Source near out of time events affecting count rate and/or position
Near bright segment 7 Source on or near bright segment affecting count rate and/or position
Near bright source 7 Source near wings of bright source affecting count rate and/or position
Near edge of field (5) 6 7 Source on edge of field of view possibly affecting count rate and/or position
Near bad col or pix 7 Source on edge of bad column/pixel affecting count rate and/or position
Near edge of CCD (5) 6 7 Source on CCD edge possibly affecting count rate and/or position
Near cosmic ray 7 Source on or near cosmic ray affecting count rate and/or position
Near reflection arc 7 Source on or near reflection arc due to bright outside source
Near diffraction spike 7 Source on or near RGA diffraction spike (MOS only)
Affected by optical loading 7 Source is near a hole due to optical loading affecting count rate and/or position
Core of ext emission 3 7 Source is at the core of the extended emission
Poss core of ext em 7 Source is possibly at the core of the extended emission
 
 
Possibly extended 7 Source is possibly extended
Poss false in ext 3 7 Source is possibly a spurious detection in extended emission area
In extended 3 7 Source is in extended emission area
Part of extended 1 3 7 Source is due to a clump within extended emission (not a point source, not core of the extended source)
 
 
none 7 (Source comment has been removed)
A 7 (Source comment has been removed)

Note: All comments on spurious detections can be also given as a 'poss ...' with only flag 7 set.